Information Technology
About yieldWerx.
yieldWerx comprises of functionally feature rich suite of modules. At the heart of the solution is the Enterprise Modules that applies to every customer. Other modules can be selected based on the customers environment and needs. All the modules are seamlessly linked and integrated with each other with common User Experiences. Some of the modules are Web Enabled – allowing functionality to be platform independent as well as accessible from any smart device so that customers can analyze and make decisions on the spot.
yieldWerx – End-to-End Yield Management for Semiconductor Manufacturing
AUTOMATED DATA LOADING
Fully automated/lights out data loading functionality, business rules are applied to determine what is good/bad/engineering vs. production data. Ability to integrated with MES or other external systems to perform key data validation checks.
REPORTING & ANALYSIS
Over 50 standard data analysis reports for Bin, Parametric, Functional, Yield, Defect, Image data across any work center.
YIELD CALCULATION FLEXIBILITY
Ability to determine what rules should be applied to calculate yield, especially for Final Test data as well as for Wafer Sort where GDPW values are used over tested die.
RAW DATA MONITORING
Daily/Hourly Email/Email Digests, Dashboards & Real Time alerts on any raw data that failed to load to production databases. Ability to rapidly reload failed raw data files after corrections have been applied.
STANDARD DATA ACCESS FOR EXTERNAL TOOLS
Provision for SAS, JMP, Spotfire, Excel, Tableau, like tools to access data from standard or customized data views.
DATA ARCHIVE/PURGE MODULE
Feature rich/automated policy-driven data archival and purge functionality. Allows you to set data retention business rules at granular level.
ASSEMBLY MAP GENERATION
Generation of Inkless and Ink maps for Wafer Assembly in a variety of different industry and custom formats. Automated generation as well as xferring the maps to the desired Assembly Site.
EXECUTIVE DASHBOARDS
Ability to generate Executive Dashboards/Reports accessible from any Smart Device. Allows users to create their own reports in seconds. 100’s of yieldWerx widgets already designed and available. Ability to build data marts with yieldWerx and external data sources.
LOT GENEALOGY
Automatically generate Lot Genealogy from Fab to Wafer Sort/Assembly Test right down to the Die Level. Allows analysis to be performed top’s down OR bottoms up.
WAFER/RETICLE MAP DEFINITION TOOL
Reticle Definition and Wafer Map definition tool that allows you to define simple reticles to multi die and sub die reticle maps. Used then in reporting and analysis as well as Assembly.
